Emmanouil Kalligeros received the Diploma in Computer Engineering and Informatics in 1999, the MSc degree in Computer Science and Technology in 2001, and the PhD degree in Embedded Testing in 2005, all from the Computer Engineering and Informatics Department, University of Patras, Greece. Between 2006 and 2008 he served as an adjunct professor at University of Patras, University of Peloponnese and University of the Aegean, teaching courses related to electronics and digital circuits design. Since 2008, he has been a faculty member at the Information and Communication Systems Engineering Department, University of the Aegean, Samos Island, Greece, where he currently holds an assistant professor position. His main research interests include VLSI design and test, design for testability, CAD methodologies for VLSI testing, test-data compression, and Network-on-Chip (NoC) architectures. In these areas, he has published more than 30 papers in highly esteemed international journals and conferences. He also serves as an invited reviewer in various highly accredited journals,like: IEEE Transactions on Circuits and Systems II, IEEE Transactions on CAD of Integrated Circuits and Systems, IEEE Transactions on VLSI Systems, Microelectronics Journal, Integration, the VLSI Journal, IET Computers and Digital Techniques. He was also a member of the technical program committee of the INA-OCMC 2013 and 2014 workshops. Dr. Kalligeros is a member of the Technical Chamber of Greece and the IEEE.